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Derniers dépôts
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B. Pinault, Jean-Guy Tartarin, D. Saugnon, R. Leblanc. Impact of RF stress on different topologies of 100 nm X-band robust GaN LNA. Microelectronics Reliability, 2023, Special issue of 34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2023, 150, pp.115126. ⟨10.1016/j.microrel.2023.115126⟩. ⟨hal-04493506⟩
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Jean Alinei, Guillaume Arthaud, Luiz Fernando Lavado Villa, Antonio Orgiu, Sahar Karaani, et al.. Improving the repairability of technical systems, a methodological proposal based on collaborative documentation -Example/case of an open source power converter. SGE - Symposium de Génie Electrique 2023, Jul 2023, Lille, France. ⟨hal-04490872⟩
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Ilias Chorfi, Corinne Alonso, Romain Montheard, Thierry Sutto. A GaN-Based Three-Level Dual Active Half Bridge Converter With Active Cancellation of the Steady-State DC Offset Current. IECON 2022 – 48th Annual Conference of the IEEE Industrial Electronics Society, Oct 2022, Brussels, Belgium. pp.1-5, ⟨10.1109/IECON49645.2022.9968579⟩. ⟨hal-04475161⟩