Processing Impact on the Low-Frequency Noise of 1.8 V Input-Output Bulk FinFETs
Cor Claeys
(1, 2)
,
Geert Hellings
(1)
,
Hiroaki Arimura
(1)
,
Bertrand Parvais
(1)
,
Lars-Åke Ragnarsson
(1)
,
Harold Dekkers
(1)
,
Tom Schram
(1)
,
Dimitri Linten
(1)
,
Naoto Horiguchi
(1)
,
Eddy Simoen
(1)
,
Dimitri Boudier
(3)
,
B Cretu
(3)