Skip to Main content Skip to Navigation
Master Thesis

Vieillissement du TRIAC soumis à des essais de fiabilité du type HTRB

Abstract : This work deals with the TRIACs aging, used for industrial, lighting, and home appliance. We evaluated the lifetime of these TRIACs and analysed their failure mechanisms when devices were off state. The first part of this work consisted in carrying out a benchmark done on TRIACs, concepts used in reliability, and finally the impacts of the temperature and voltage of TRIAC static parameters. This work allowed us to understand the failure that may occur during the off state TRIACs. In the last part of this document, we analysed experimentally the impact of the temperature and voltage (DC, AC) on the lifetime of TRIACs. This study allowed us to define the accelerations factors of failures. The challenge of this work is to build a lifetime prediction model for TRIACs. Thus, we proposed a model based on experimental results.
Document type :
Master Thesis
Complete list of metadatas
Contributor : Cnam - Service Commun de la Documentation - Bibliothèque Centrale <>
Submitted on : Wednesday, May 30, 2018 - 4:57:29 PM
Last modification on : Saturday, February 8, 2020 - 12:00:13 PM
Long-term archiving on: : Friday, August 31, 2018 - 5:49:37 PM


Files produced by the author(s)


  • HAL Id : dumas-01803690, version 1



Gilles Rousseau. Vieillissement du TRIAC soumis à des essais de fiabilité du type HTRB. Electronique. 2016. ⟨dumas-01803690⟩



Record views


Files downloads