Genome-wide association mapping of three agronomic traits and resistance to Parastagonospora nodorum in spring and winter wheat

Abstract : Bread wheat (Triticum aestivum, 2n = 6x = 42, AABBDD) is one of the most cultivated cereal worldwide. Plant height (PH), days to heading (DH, or heading date) and days to maturity (DM) are among the most important agronomic traits in wheat and often essential to ensure a good adaptation to the environment. Stagonospora nodorum blotch (SNB), caused by the necrotrophic fungus Parastagonospora nodorum, is one of the most damaging disease in wheat all around the world. Affecting both leaves and glumes, SNB is able to cause significant losses in grain yield up to 31% and quality. P. norodum is the major leaf blotch pathogen on wheat in Norway. The aim of this study was to determine the genetic control of these three developmental traits and the adult-plant resistance (leaf blotch) for SNB in spring and winter wheat panels. These traits are governed by multiple and mostly weak quantitative trait loci. Through genome- wide association mapping (GWAS), several genes have been validated (vernalization genesVRN1, reduced-height genes, Rht-B1, Rht-D1 and Rht24) and other major loci have been identified, on different chromosomes.
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Master Thesis
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Camille Branchereau. Genome-wide association mapping of three agronomic traits and resistance to Parastagonospora nodorum in spring and winter wheat. Life Sciences [q-bio]. 2018. ⟨dumas-01955241⟩

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