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Master Thesis

Conception d'une expérience de topographie aux rayons X : application à l'étude de défauts intrinsèques et extrinsèques dans les cristaux

Abstract : X Rays Topography (XRT) is a characterization method based on diffraction contrast. Applicable to crystallized solids, it has ability to identify and study structural defects caused by material conception or forming. His development take place in laboratory source or synchrotron source in several geometry. Conception of XRT experience in Lang geometry require a special attention, in comparison with multiple possibility of this setting. We have design this experience, test and set it, at last we have demonstrate that it was possible to make XRT image on single crystalline samples.
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Master Thesis
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https://dumas.ccsd.cnrs.fr/dumas-00597967
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Submitted on : Friday, June 3, 2011 - 9:28:11 AM
Last modification on : Saturday, February 8, 2020 - 11:52:02 AM
Long-term archiving on: : Sunday, September 4, 2011 - 2:21:06 AM

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Jérôme Debray. Conception d'une expérience de topographie aux rayons X : application à l'étude de défauts intrinsèques et extrinsèques dans les cristaux. Matériaux. 2010. ⟨dumas-00597967⟩

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